"The CNX shall be tested with the specified Low Temperature Step Stress and High Temperature Step Stress test. Each test shall start at 20℃ and then gradually adjust the temperature up or down by 10℃ with the minimum dwell time of 15 minutes increments until the device can no longer operate correctly. When the CNX becomes non-operational, mark the last operational temperature and record the lower or higher operating limits, and test progress until failure with recorded Lower/Upper Destruction Limit: • Non operational. • No return to operational state when the Temperature Stress digress • At the limit of Temperature Test Chamber *reference image only, test to above written standard"